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Empowering Scientific Innovation with Precision Measurement, Providing Reliable Equipment for Manufacturing Industry
1 Years
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| Price : | Price Negotiable | Contact us for a detailed quote |
| Payment Terms : | T/T |
| Brand Name : | Truth Instruments |
Multifunctional Spin-Test Magneto-Optic Kerr Microscope
KMPL-S
This instrument enables high-resolution magnetic domain imaging of magnetic materials and spintronic chips, with a resolution of up to 250 nm. It is equipped with a highly intelligent control system and multifunctional magnetic field probe station, integrating optical imaging, multi-dimensional magnetic fields, electrical transport characterization, microwave testing, and variable temperature modules. With a single button operation, it can observe magnetic dynamics under various excitation conditions, such as magnetic fields, currents, spin-orbit torque, and spin-transfer torque. It features microsecond-level fast-response magnetic fields for high-precision magnetic domain velocity and DMI measurements.
| Optical Resolution: | 250 nm |
| Objectives: | 5x,20x,50x,100x,non-magnetic |
| In-Plane Magnetic Field: | 1 T@air gap 5 mm; 0.5 T@air gap 10 mm; 0.3 T@air gap 16 mm |
| Vertical Magnetic Field: | 0.25 T@single pole |
| Magnetic Field Resolution | PID closed-loop feedback regulation, resolution 0.05 mT |
| Microsecond Ultrafast Pulse Vertical Magnetic Field | 60 mT, rise time 0.5μs, pulse width l μs - 10 μs |
| Probe Station | Compatible with 4-8 sets of non-magnetic probe holder |
| Elctrical Source Meter | Keithley 6221, Keithley 2182A |
| Testing Functions | Magnetic domain dynamic observation, global/micro-region hysteresis loop mapping based on Kerrsignals, domain wall velocity measurement, DMl measurement, anomalous Hall resistance, SOT switching, I-R hysteresis loop scanning with synchronized Kerr imaging, and curve mapping of Hallresistance changes in electronic devices under magnetic and current variations, along with corresponding Kerrimages |
Magnetic Domain Distribution in Thin Films
MgO(substrate)/Co/PtSample**: Magnetic defects caused by lattice
mismatch between MgO crystal substrate and Co.
Poor-Quality Magnetic Films**:Snowflake-like magnetic domains during magneti creversal.
High-Quality Magnetic Films**Uniform magnetic domain structures
with smooth edges.
Characterization of local magnetic intrinsic parameters
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