Product Description:

The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers multi-mode measurement capabilities for surface analysis at the atomic resolution level. This advanced microscope allows for detailed examination of samples with a size of up to 25 mm, providing researchers with invaluable insights into various materials and structures.

One of the key features of the Atomic Force Microscope is its versatile imaging modes, which include topography, phase, friction, lateral force, magnetic force, and electrostatic force imaging. This wide range of imaging modes allows users to gather comprehensive data on the physical and chemical properties of the samples under study, making it an indispensable tool for researchers across different fields.

With a remarkable resolution of 0.04 nm, the Atomic Force Microscope enables users to achieve high precision imaging and analysis, capturing even the smallest details on the sample surface. This level of resolution is crucial for studying nanoscale features and structures, providing researchers with crucial information for their investigations.

The Atomic Force Microscope offers a scanning range of 100 μm x 100 μm x 10 μm, allowing for detailed and accurate scanning of samples across a wide area. This wide scanning range makes it suitable for a variety of applications, from nanotechnology research to material science and beyond.

Furthermore, the Atomic Force Microscope boasts a scan speed range of 0.1 Hz to 30 Hz, providing users with the flexibility to adjust the scanning speed according to their specific requirements. This feature enables efficient data acquisition and analysis, saving time and enhancing productivity in research and development processes.

In conclusion, the Atomic Force Microscope is a state-of-the-art instrument that offers multi-mode measurement capabilities, surface analysis at the atomic resolution level, and high precision imaging. With its advanced features and versatile imaging modes, this microscope is an indispensable tool for researchers seeking to explore and understand the intricate world of nanoscale structures and materials.

Features:

• Product Name: Atomic Force Microscope
• Sample Stage: Piezo-driven XYZ Stage
• Sample Size: Up To 25 Mm
• Resolution: 0.04nm (Nanometer Resolution)
• Scan Speed: 0.1Hz-30Hz
• Imaging Modes: Topography, Phase, Friction, Lateral Force, Magnetic Force, Electrostatic Force

Technical Parameters:

Applications:

Truth Instruments AtomEdge Pro Atomic Force Microscope, originating from China, is a cutting-edge tool designed for nanoscale characterization across a variety of applications and scenarios. With its advanced features and capabilities, this scanning force microscope is suitable for a wide range of research and industrial environments.

The AtomEdge Pro is equipped with a piezo-driven XYZ stage, allowing for precise sample manipulation and positioning. This feature is essential for conducting detailed measurements and imaging at the nanoscale level. The microscope boasts an impressive resolution of 0.04nm, enabling users to capture high-definition images with exceptional clarity.

One of the key strengths of the AtomEdge Pro is its versatility in imaging modes. It supports multiple modes, including topography, phase, friction, lateral force, magnetic force, and electrostatic force. This multi-mode measurement capability allows researchers to gather comprehensive data on various surface properties and interactions.

Furthermore, the AtomEdge Pro offers a wide scanning range of 100 μm X 100 μm X 10 μm, enabling users to explore larger sample areas while maintaining high precision and accuracy. This extended range makes the microscope ideal for analyzing diverse sample types and sizes.

Whether in academic research labs, industrial R&D facilities, or quality control applications, the Truth Instruments AtomEdge Pro Atomic Force Microscope excels in providing detailed insights into nanoscale structures and properties. Its high scan speed range of 0.1Hz to 30Hz ensures efficient data acquisition, making it suitable for time-sensitive experiments and production processes.

In conclusion, the AtomEdge Pro is a powerful tool for nanoscale characterization, offering unparalleled capabilities in scanning force microscopy and multi-mode measurement. Its advanced features and reliable performance make it a valuable asset for scientists, engineers, and researchers working in various fields.