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Empowering Scientific Innovation with Precision Measurement, Providing Reliable Equipment for Manufacturing Industry
1 Years
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| Brand Name : | Truth Instruments |
| Model Number : | AtomMax |
| Price : | Price Negotiable | Contact us for a detailed quote |
| Payment Terms : | T/T |
High Precision Scanning Probe Microscope 0.15 Nm Resolution
The Atomic Force Microscope (AFM) is a cutting-edge instrument that offers exceptional capabilities for nanometer resolution surface analysis. With a scanning range of 100 μm X 100 μm X 10 μm, this AFM product provides precise imaging and measurement of samples with dimensions up to 200 mm.
One of the key features of this AFM is its versatility in probe types. Users can choose from a variety of probe materials including Silicon, Diamond, Gold, Platinum, and Carbon Nanotube probes, allowing for tailored approaches to different sample types and imaging needs.
When it comes to imaging modes, the Atomic Force Microscope excels in providing multiple options to suit diverse applications. The available imaging modes include Contact mode for high-resolution topographic imaging, Tapping mode for gentle imaging of delicate samples, Non-Contact mode for non-invasive surface analysis, Lateral Force mode for frictional mapping, Force Modulation mode for mechanical property mapping, and Phase Imaging mode for enhanced contrast imaging.
With a remarkable resolution of 0.15 nm, this AFM product ensures detailed and accurate imaging of samples at the nanoscale level. Researchers and scientists can rely on this precision instrument to investigate surface properties, characterize materials, and study nanostructures with high clarity and resolution.
In summary, the Atomic Force Microscope offers unparalleled capabilities in nanometer resolution surface analysis. Its wide scanning range, compatibility with various probe types, versatile imaging modes, and exceptional resolution make it a valuable tool for scientific research, materials analysis, and nanotechnology applications.
| Imaging Modes | Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, Phase Imaging |
| Scanning Angle | 0-360° |
| Sample Size | Up To 200 mm |
| Scanning Range | 100 μm x 100 μm x 10 μm |
| Resolution | 0.15 nm |
| Probe Type | Silicon, Diamond, Gold, Platinum, Carbon Nanotube |
Truth Instruments presents the AtomMax Atomic Force Microscope, a cutting-edge instrument designed and manufactured in CHINA. This advanced scanning probe microscope offers a wide range of applications across various fields due to its exceptional features and capabilities.
Product Application Occasions and Scenarios:
1. Nanotechnology Research: The AtomMax is ideal for nanotechnology research in academic institutions and research laboratories. Researchers can utilize the different probe types including Silicon, Diamond, Gold, Platinum, and Carbon Nanotube to study materials at the nanoscale level.
2. Material Science: The high-resolution imaging modes such as Contact, Tapping, Non-Contact, Lateral Force, Force Modulation, and Phase Imaging make the AtomMax suitable for material science applications. It can analyze surface properties, defects, and structures of various materials.
3. Semiconductor Industry: In the semiconductor industry, the AtomMax plays a crucial role in analyzing semiconductor materials and devices. Its Scanning Range of 100 μm X 100 μm X 10 μm and Scanning Angle of 0-360° enable precise measurements and imaging of semiconductor components.
4. Biological Research: Researchers in the field of biology can benefit from the AtomMax for studying biological samples at the nanoscale. The high resolution of 0.15 Nm allows for detailed imaging of biological structures and interactions.
5. Surface Analysis: Whether in academic research or industrial applications, the AtomMax can be used for surface analysis of various materials. Its versatile imaging modes provide insights into surface roughness, adhesion, and mechanical properties.
Overall, the Truth Instruments AtomMax Atomic Force Microscope is a versatile and high-performance instrument suitable for a wide range of applications. Its advanced features and capabilities make it an indispensable tool for researchers and professionals working in fields such as nanotechnology, material science, semiconductors, and biological research.
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