Product Description:

The Atomic Force Microscope (AFM) is a highly advanced instrument designed for multifunctional measurement, offering unparalleled versatility and precision in nanoscale imaging and analysis. This state-of-the-art AFM integrates a variety of measurement modes, including Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Force Microscope (KPFM), Piezoelectric Force Microscope (PFM), Magnetic Force Microscope (MFM), and Force Curve analysis, making it an indispensable tool for researchers and engineers working at the forefront of nanotechnology and material science.

One of the standout features of this AFM is its exceptional scanning range of 100 μm * 100 μm * 10 μm, which allows users to explore surface topographies and properties across a broad area with high precision. This extensive scanning capability ensures that both large-scale and fine nanoscale features can be accurately characterized without compromising resolution or detail.

The instrument boasts an impressively low noise level in the Z direction, measured at just 0.04 Nm. This minimal noise footprint is crucial for achieving high fidelity measurements and reliable data, enabling researchers to detect subtle variations in surface morphology and material properties with nanometer resolution. Such sensitivity is essential for applications requiring precise force measurements and surface interactions at the atomic or molecular scale.

The AFM supports multiple working modes to accommodate a wide range of sample types and experimental conditions. These include Contact Mode, where the probe maintains continuous contact with the sample surface; Tap Mode, which minimizes damage to delicate samples by intermittently contacting the surface; Phase Imaging Mode, which provides detailed contrast based on material properties; Lift Mode, used to separate topographical and magnetic or electrostatic signals; and Multi-directional Scanning Mode, which enhances image accuracy by scanning samples from various angles. This flexibility ensures that users can tailor their approach to the specific requirements of their research.

In addition to its technical capabilities, the AFM can accommodate samples up to 25 mm in size, providing ample space for diverse specimen types, from semiconductor wafers and biological tissues to polymers and nanostructured materials. This generous sample size compatibility broadens the scope of potential studies and facilitates seamless integration into existing laboratory workflows.

Designed with nanometer resolution at its core, this AFM delivers detailed surface imaging and quantitative analysis that are critical for advancing nanoscience and nanotechnology. By combining multifunctional measurement modes with a wide scanning range and ultra-low noise performance, it empowers users to conduct comprehensive investigations of electrical, magnetic, piezoelectric, and mechanical properties at the nanoscale.

Whether used for academic research, industrial quality control, or advanced materials development, this AFM stands out as a powerful and reliable instrument. Its integration of multiple microscopy techniques within one platform not only streamlines experimental processes but also enhances the depth and breadth of data that can be obtained. This makes it an invaluable asset for anyone seeking to push the boundaries of nanoscale characterization and innovation.

Features:

• Product Name: Atomic Force Microscope
• Nonlinearity: 0.15% in the XY direction and 1% in the Z direction
• Sample Size: Up to 25 mm
• Multifunctional Measurement Capabilities:
  • Electrostatic Force Microscope (EFM)
  • Scanning Kelvin Microscope (KPFM) for Scanning Kelvin Probe Microscopy
  • Piezoelectric Force Microscope (PFM)
  • Magnetic Force Microscope (MFM)
  • Force Curve Analysis for Nanomechanical Testing
• Image Sampling Point: Maximum resolution of the scanning probe image is 4096*4096 pixels
• Working Modes:
  • Contact Mode
  • Tap Mode
  • Phase Imaging Mode
  • Lift Mode
  • Multi-directional Scanning Mode
• Advanced Nanomechanical Testing capabilities for precise material characterization

Technical Parameters:

This Atomic Force Microscope serves as a cutting-edge Nanoscale Characterization Platform, enabling Nanoscale Analysis with Atomic Resolution for diverse scientific and industrial applications.

Applications:

The Truth Instruments AtomEdge Pro Atomic Force Microscope, proudly made in China, is a cutting-edge tool designed for a wide range of advanced scientific applications. Its multifunctional measurement capabilities include Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Magnetic Force Microscopy (MFM), and Force Curve analysis, making it an exceptionally versatile instrument for researchers and engineers working at the nanoscale.

In the realm of nanomechanical testing, the AtomEdge Pro excels by providing precise measurements of mechanical properties at the nanoscale. This is critical for materials science, semiconductor research, and biomaterials development, where understanding surface mechanics and interactions at extremely small scales can lead to innovations in product design and performance. The system's nonlinearity of only 0.15% in the XY direction and 1% in the Z direction ensures highly accurate and reliable data, essential for quantitative analysis in these demanding fields.

Piezoresponse Force Microscopy (PFM) is another key application area for the AtomEdge Pro. This technique allows researchers to study piezoelectric and ferroelectric materials by mapping their electromechanical behavior with nanoscale resolution. Such insights are vital for the development of sensors, actuators, and energy harvesting devices. The high scanning range of 100 μm * 100 μm * 10 μm combined with a scanning rate adjustable between 0.1 to 30 Hz provides flexibility to capture detailed surface features efficiently. Additionally, the maximum image sampling point resolution of 4096 * 4096 ensures that even the finest details of the probe image are captured with exceptional clarity.

Besides PFM, the AtomEdge Pro’s capabilities in Magnetic Force Microscopy (MFM) and Scanning Kelvin Probe Force Microscopy (KPFM) open up further possibilities for exploring magnetic properties and surface potential variations at the nanometer scale. These applications are invaluable in fields such as spintronics, corrosion research, and semiconductor device characterization.

Overall, the AtomEdge Pro Atomic Force Microscope from Truth Instruments is ideal for laboratories engaged in cutting-edge nanoscience and nanotechnology research. Its multifunctional measurement capabilities, combined with high precision and resolution, enable detailed investigation of material properties under various conditions, making it a vital instrument in academic research, industrial R&D, and quality control scenarios.

Support and Services:

Our Atomic Force Microscope (AFM) product is backed by comprehensive technical support and services to ensure optimal performance and customer satisfaction. Our expert team provides assistance with installation, calibration, and routine maintenance to keep your AFM operating at peak efficiency.

We offer detailed user manuals and online resources to help you understand the full capabilities of your AFM and troubleshoot common issues. Regular software updates and upgrades are available to enhance functionality and incorporate the latest technological advancements.

For complex technical problems, our support specialists are ready to provide remote diagnostics and, if necessary, on-site service to minimize downtime. Additionally, we provide training sessions and workshops to help users maximize the potential of their AFM systems.

We are committed to delivering prompt and effective support throughout the lifecycle of your Atomic Force Microscope, ensuring that your research and analysis projects proceed smoothly and successfully.

FAQ:

Q1: What is the brand and model of the Atomic Force Microscope?

A1: The Atomic Force Microscope is from the brand Truth Instruments, and the model number is AtomEdge Pro.

Q2: Where is the AtomEdge Pro Atomic Force Microscope manufactured?

A2: The AtomEdge Pro is manufactured in China.

Q3: What are the key features of the Truth Instruments AtomEdge Pro?

A3: The AtomEdge Pro offers high-resolution surface imaging, precise force measurements, and versatile scanning modes suitable for various materials and applications.

Q4: What types of samples can be analyzed using the AtomEdge Pro?

A4: The AtomEdge Pro can analyze a wide range of samples including biological specimens, polymers, semiconductors, and nanomaterials.

Q5: Is the AtomEdge Pro suitable for both research and industrial applications?

A5: Yes, the AtomEdge Pro is designed to meet the needs of both academic research and industrial quality control with its advanced features and reliability.