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All-in-One Detection Platform – Custom Modules & Multi-Force Microscopy For

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All-in-One Detection Platform – Custom Modules & Multi-Force Microscopy For

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All-in-One Detection Platform – Custom Modules & Multi-Force Microscopy For

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge nanoscale characterization platform designed to provide unparalleled precision and versatility in surface analysis. With a ...

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Atomic Force Microscope with custom modules

Multi-force microscopy for materials science

All-in-one detection platform for microscopy

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